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Xinfei and Prof. Stan's Paper won the "Best-Of-SELSE" Award

posted Mar 28, 2017, 6:34 PM by Xinfei Guo
Xinfei and Prof. Stan got the Best Paper Award ("Best-Of-SELSE") at the 13th IEEE Workshop on Silicon Errors in Logic–System Effects (SELSE-13) held in Boston in March. They are also invited to present at a special session in the upcoming IEEE Dependable Systems and Networks (DSN) conference in Denver. 

Xinfei Guo, Mircea R. Stan, "Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery", Proc. of 13th IEEE Workshop on Silicon Errors in Logic–System Effects (SELSE-13), Boston, MA, March 2017.
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